000			005020000a22001930004500
245			_aDigital systems testing and testable design
100			_aAbramovici, Miron
100			_aBreuer, Melvin A.
100			_aFriedman, Arthur D.
250			_arev.
260			_aNew York _bIEEE _c1990
300			_axvii, 652p. : ill.
020			_a0780310624
080			_a621.38 _bA2
650			_aDIGITAL SYSTEMS - Testing
650			_aDIGITAL SYSTEMS - Testable Design
041			_aEN
942			_cBK
999			_c33560 _d33560