000 00404nam a2200133 4500
999 _c178752
_d178752
027 _aIEC publication 319
_q1970
041 _aeng
942 _cSD
110 _aINTERNATIONAL ELECTROTECHNICAL COMMISSION
245 _aIEC publication 319 : presentation of reliability data on electronic components
260 _aGeneva
_bINTERNATIONAL ELECTROTECHNICAL COMMISSION
300 _a29p.
500 _aSTD3212