000 00383nam a2200133 4500
999 _c178688
_d178688
027 _aIEC publication 272
_q1968
041 _aeng
942 _cSD
110 _aINTERNATIONAL ELECTROTECHNICAL COMMISSION
245 _aIEC publication 272 : preliminary reliability considerations
260 _aGeneva
_bINTERNATIONAL ELECTROTECHNICAL COMMISSION
300 _a7p.
500 _aSTD3199