| 000 | 003810000a22001330004500 | ||
|---|---|---|---|
| 245 | _aIEEE standard methods of testing (SHO 2568) transistors | ||
| 110 | _aInstitute of Electrical & Electronics Engineers, New York | ||
| 260 |
_aNew York _bIEEE _c1977 |
||
| 440 | _aIEEE standards; 218-1956 | ||
| 080 |
_a621.382.3 _bI6 |
||
| 650 | _aStandards | ||
| 041 | _aEN | ||
| 942 | _cBK | ||
| 999 |
_c116699 _d116699 |
||