Library, University of Moratuwa, Sri Lanka catalog › Results of search for 'ccl=Provider:IEEE and au:Institute of Electrical and Electronics Engineers'

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		Biomedical image analysis by The Institute of Electrical and Electronics Engineers \| IEEE WORKSHOP ON BIOMEDICAL IMAGE ANALYSIS (1994 : Seattle). Language: EN Publisher: Los Alamitos, California IEEE Computer Society Press 1994Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 004.932.2:61 I4. Place hold Add to cart (remove)
		No cover image available IEEE recommended practice for electric power distribution for industrial plants. by Institute of Electrical Electronics Engineers. Edition: 5th ed.Language: EN Publisher: New York IEEE 1976Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 621.316.1 I6. Place hold Add to cart (remove)
		No cover image available IEEE recommended practice for insulation testing of large AC rotating machinary with high voltage by Institute of Electrical & Electronics Engineers, New York US. Language: EN Publisher: New York IEEE 1974Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 621.313:3 I6. Place hold Add to cart (remove)
		No cover image available IEEE standard definitions and requirements thyristor AC power controllers by Institute of Electrical & Electronics Engineers, New York US. Language: EN Publisher: New York IEEE 1981Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 621.382(083.7) I6. Place hold Add to cart (remove)
		No cover image available IEEE standard letter symbols for (SHO 1446) semiconductor devices by Institute of Electrical & Electronics Engineers, New York. Language: EN Publisher: New York IEEE 1963Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 621.382:003.62 I6. Place hold Add to cart (remove)
		No cover image available IEEE standard methods of testing (SHO 2568) transistors by Institute of Electrical & Electronics Engineers, New York. Language: EN Publisher: New York IEEE 1977Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 621.382.3 I6. Place hold Add to cart (remove)
		No cover image available IEEE standards for high power (greater than 300 Watts, peak) pulse transformers standard by Institute of Electrical & Electronics Engineers, New York US. Language: EN Publisher: New York IEEE 1976Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 621.314 I6. Place hold Add to cart (remove)
		No cover image available IEEE standards for low power pulse transformers by Institute of Electrical & Electronics Engineers, New York US. Language: EN Publisher: New York IEEE 1975Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 621.314 I6. Place hold Add to cart (remove)
		No cover image available IEEE standards on solid state devices : semiconductor terms, definitions of (SHO 1297) by Institute of Electrical & Electronics Engineers, New York. Language: EN Publisher: New York IEEE 1960Availability: Items available for loan: Library, University of Moratuwa (1). Location(s): Lending Collection Call number: 621.382(038) I6. Place hold Add to cart (remove)

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