IEEE standard methods of testing (SHO 2568) transistors (Record no. 116699)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 003810000a22001330004500 |
| 080 ## - UNIVERSAL DECIMAL CLASSIFICATION NUMBER | |
| Universal Decimal Classification number | 621.382.3 |
| Item number | I6 |
| 041 ## - LANGUAGE CODE | |
| Language code of text/sound track or separate title | EN |
| 110 ## - MAIN ENTRY--CORPORATE NAME | |
| Corporate name or jurisdiction name as entry element | Institute of Electrical & Electronics Engineers, New York |
| 245 ## - TITLE STATEMENT | |
| Title | IEEE standard methods of testing (SHO 2568) transistors |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. (IMPRINT) | |
| Place of publication, distribution, etc. | New York |
| Name of publisher, distributor, etc. | IEEE |
| Date of publication, distribution, etc. | 1977 |
| 440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE | |
| Title | IEEE standards; 218-1956 |
| 650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name as entry element | Standards |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) | |
| Koha item type | Book |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Permanent Location | Current Location | Shelving location | Date acquired | Total Checkouts | Full call number | Barcode | Date last seen | Price effective from | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Library, University of Moratuwa | Library, University of Moratuwa | Lending Collection | 05/02/2014 | 621.382.3 I6 | 45122 | 05/02/2014 | 05/02/2014 | Book |